TY  - BOOK
AU  - Changhwan Shin
TI  - Variation-Aware Advanced CMOS Devices and SRAM
SN  - 9789401775977
PY  - 2016///
PB  - Springer Netherlands
KW  - Physics and Astronomy
UR  - https://doi.org/10.1007/978-94-017-7597-7
ER  -