TY  - BOOK
AU  - Edmund G. Seebauer, Meredith C. Kratzer
TI  - Charged Semiconductor Defects
SN  - 9781848820593
PY  - 2009///
PB  - Springer London
KW  - Physics and Astronomy
UR  - https://doi.org/10.1007/978-1-84882-059-3
ER  -