TY  - DATA
AU  - J. Giber, F. Beleznay, I. C. Szep, J. Laszlo
TI  - Defect Complexes in Semiconductor Structures
SN  - 9783540394563
PY  - 1983///
PB  - Springer Berlin Heidelberg
KW  - Physics and Astronomy
UR  - https://doi.org/10.1007/3-540-11986-8
ER  -