000			00447nam a2200145Ia 4500
008			230130s9999||||xx |||||||||||||| ||und||
020			_a9781848820593
100			_aEdmund G. Seebauer, Meredith C. Kratzer
245		0	_aCharged Semiconductor Defects
250			_a2009
260			_bSpringer London _c2009
440			_aEngineering Materials and Processes
650			_aPhysics and Astronomy
856			_uhttps://doi.org/10.1007/978-1-84882-059-3
999			_c17444 _d17444