Charged Semiconductor Defects (Record no. 17444)

000 -LEADER
fixed length control field 00447nam a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230130s9999||||xx |||||||||||||| ||und||
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781848820593
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Edmund G. Seebauer, Meredith C. Kratzer
245 #0 - TITLE STATEMENT
Title Charged Semiconductor Defects
250 ## - EDITION STATEMENT
Edition statement 2009
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Springer London
Date of publication, distribution, etc. 2009
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Engineering Materials and Processes
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Physics and Astronomy
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1007/978-1-84882-059-3">https://doi.org/10.1007/978-1-84882-059-3</a>
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Barcode Date last seen Uniform Resource Identifier Price effective from Koha item type
      Accessible Online ICTS ICTS 01/30/2023 EBK14209 01/30/2023 https://doi.org/10.1007/978-1-84882-059-3 01/30/2023 electronic book