X-Ray Microscopy II

By: David Sayre, Malcolm Howells, Janos Kirz, Harvey RarbackMaterial type: Computer fileComputer fileSeries: Springer Series in Optical SciencesPublication details: Springer Berlin Heidelberg 1988Edition: 1988ISBN: 9783540392460Subject(s): Physics and AstronomyOnline resources: Click here to access online
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Item type Current library Call number URL Status Date due Barcode Item holds
electronic book electronic book ICTS
Link to resource Accessible Online EBK16695
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